1 × Germany
1 × USA
K.Kang K.Roy K.Kim A.E.Islam B.C.Paul H.Kufluoglu
reliabl (2) circuit (2) degrad (2) under (2) estim (2) nbti (2) character (1) nanoscal (1) perform (1) tempor (1)
Person: Muhammad Ashraful Alam
Wrote 2 papers:
- DAC-2007-KangKIAR #estimation #metric #online #reliability #using
- Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement (KK, KK, AEI, MAA, KR), pp. 358–363.
- DATE-2006-PaulKKAR #design #estimation #performance #reliability
- Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits (BCP, KK, HK, MAA, KR), pp. 780–785.