Tejasvi Das, P. R. Mukund
Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry
DATE, 2007.
@inproceedings{DATE-2007-DasM,
author = "Tejasvi Das and P. R. Mukund",
booktitle = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1266366.1266646",
isbn = "978-3-9810801-2-4",
pages = "1277--1282",
publisher = "{ACM}",
title = "{Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry}",
year = 2007,
}











