Tejasvi Das, P. R. Mukund
Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry
DATE, 2007.
@inproceedings{DATE-2007-DasM, author = "Tejasvi Das and P. R. Mukund", booktitle = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}", doi = "10.1145/1266366.1266646", isbn = "978-3-9810801-2-4", pages = "1277--1282", publisher = "{ACM}", title = "{Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry}", year = 2007, }