Anshuman Chandra, Felix Ng, Rohit Kapur
Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction
DATE, 2008.
@inproceedings{DATE-2008-ChandraNK,
author = "Anshuman Chandra and Felix Ng and Rohit Kapur",
booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2008.4484724",
isbn = "978-3-9810801-3-1",
pages = "462--467",
publisher = "{IEEE}",
title = "{Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction}",
year = 2008,
}