Travelled to:2 × Germany
4 × France
4 × USA
Collaborated with:M.R.Mercer T.W.Williams A.Chandra S.Kundu D.E.Ross P.Bhattacharya Y.Kanzawa F.Ng R.Galivanche A.Rubio S.Chattopadhyay I.Sengupta N.Oh J.Sproch K.M.Butler J.Liou L.Wang K.Cheng J.Dworak
Talks about:test (6) scan (4) effici (3) order (3) architectur (2) diagnosi (2) binari (2) volum (2) power (2) fault (2)
Person: Rohit Kapur
DBLP: Kapur:Rohit
Contributed to:
2015
201320092008200720032002200219921991Wrote 10 papers:
- DATE-2015-KunduBK #design #fault #testing
- Fault diagnosis in designs with extreme low pin test data compressors (SK, PB, RK), pp. 1285–1288.
- DAC-2013-KunduCSK
- An ATE assisted DFD technique for volume diagnosis of scan chains (SK, SC, IS, RK), p. 6.
- DATE-2009-ChandraKK #adaptation #scalability
- Scalable Adaptive Scan (SAS) (AC, RK, YK), pp. 1476–1481.
- DATE-2008-ChandraNK #architecture #power management #reduction #testing
- Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction (AC, FN, RK), pp. 462–467.
- DATE-2007-GalivancheKR #testing
- Testing in the year 2020 (RG, RK, AR), pp. 960–965.
- DATE-2003-OhKWS #architecture #feedback #using
- Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture (NO, RK, TWW, JS), pp. 10110–10115.
- DAC-2002-LiouWCDMKW #fault #multi #performance #testing #using
- Enhancing test efficiency for delay fault testing using multiple-clocked schemes (JJL, LCW, KTC, JD, MRM, RK, TWW), pp. 371–374.
- DATE-2002-KapurWM #logic
- Directed-Binary Search in Logic BIST Diagnostics (RK, TWW, MRM), p. 1121.
- DAC-1992-MercerKR #functional #generative #order #performance
- Functional Approaches to Generating Orderings for Efficient Symbolic Representations (MRM, RK, DER), pp. 624–627.
- DAC-1991-ButlerRKM #diagrams #heuristic #order #performance
- Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams (KMB, DER, RK, MRM), pp. 417–420.