Design as you see FIT: System-level soft error analysis of sequential circuits
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Daniel E. Holcomb, Wenchao Li, Sanjit A. Seshia
Design as you see FIT: System-level soft error analysis of sequential circuits
DATE, 2009.

DATE 2009
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@inproceedings{DATE-2009-HolcombLS,
	author        = "Daniel E. Holcomb and Wenchao Li and Sanjit A. Seshia",
	booktitle     = "{Proceedings of the 13th Conference on Design, Automation and Test in Europe}",
	pages         = "785--790",
	publisher     = "{IEEE}",
	title         = "{Design as you see FIT: System-level soft error analysis of sequential circuits}",
	year          = 2009,
}

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