Sheng Yang, Bashir M. Al-Hashimi, David Flynn, S. Saqib Khursheed
Scan based methodology for reliable state retention power gating designs
DATE, 2010.
@inproceedings{DATE-2010-YangAFK,
author = "Sheng Yang and Bashir M. Al-Hashimi and David Flynn and S. Saqib Khursheed",
booktitle = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
pages = "69--74",
publisher = "{IEEE}",
title = "{Scan based methodology for reliable state retention power gating designs}",
year = 2010,
}