Abbas Rahimi, Luca Benini, Rajesh K. Gupta
Analysis of instruction-level vulnerability to dynamic voltage and temperature variations
DATE, 2012.
@inproceedings{DATE-2012-RahimiBG,
acmid = "2492980",
author = "Abbas Rahimi and Luca Benini and Rajesh K. Gupta",
booktitle = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-1-4577-2145-8",
pages = "1102--1105",
publisher = "{IEEE}",
title = "{Analysis of instruction-level vulnerability to dynamic voltage and temperature variations}",
year = 2012,
}











