Andrew DeOrio, Qingkun Li, Matthew Burgess, Valeria Bertacco
Machine learning-based anomaly detection for post-silicon bug diagnosis
DATE, 2013.
@inproceedings{DATE-2013-DeOrioLBB,
acmid = "2485411",
author = "Andrew DeOrio and Qingkun Li and Matthew Burgess and Valeria Bertacco",
booktitle = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-4503-2153-2",
pages = "491--496",
publisher = "{EDA Consortium San Jose, CA, USA / ACM DL}",
title = "{Machine learning-based anomaly detection for post-silicon bug diagnosis}",
year = 2013,
}