Fault modeling in controllable polarity silicon nanowire circuits
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Hassan Ghasemzadeh Mohammadi, Pierre-Emmanuel Gaillardon, Giovanni De Micheli
Fault modeling in controllable polarity silicon nanowire circuits
DATE, 2015.

DATE 2015
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@inproceedings{DATE-2015-MohammadiGM,
	acmid         = "2755856",
	author        = "Hassan Ghasemzadeh Mohammadi and Pierre-Emmanuel Gaillardon and Giovanni De Micheli",
	booktitle     = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-3-9815370-4-8",
	pages         = "453--458",
	publisher     = "{ACM}",
	title         = "{Fault modeling in controllable polarity silicon nanowire circuits}",
	year          = 2015,
}

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