Elizabeth M. Rudnick, John G. Holm, Daniel G. Saab, Janak H. Patel
Application of Simple Genetic Algorithms to Sequential Circuit Test Generation
DATE, 1994.
@inproceedings{EDAC-1994-RudnickHSP,
author = "Elizabeth M. Rudnick and John G. Holm and Daniel G. Saab and Janak H. Patel",
booktitle = "{Proceedings of the European Conference on Design Automation (EDAC), European Test Conference (ETC) and the European Event in ASIC Design (EUROASIC)}",
isbn = "0-8186-5410-4",
pages = "40--45",
publisher = "{IEEE Computer Society}",
title = "{Application of Simple Genetic Algorithms to Sequential Circuit Test Generation}",
year = 1994,
}