Oleg Okun, Matti Pietikäinen
Automatic Ground-Truth Generation for Skew-Tolerance Evaluation of Document Layout Analysis Methods
ICPR, 2000.
@inproceedings{ICPR-v4-2000-OkunP,
author = "Oleg Okun and Matti Pietikäinen",
booktitle = "{Proceedings of the 15th International Conference on Pattern Recognition, Volume 4}",
doi = "10.1109/ICPR.2000.902937",
isbn = "0-7695-0750-6",
pages = "4376--4379",
publisher = "{IEEE Computer Society}",
title = "{Automatic Ground-Truth Generation for Skew-Tolerance Evaluation of Document Layout Analysis Methods}",
year = 2000,
}











