Reou Ando, Seiji Sato, Chihiro Uchida, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Masanobu Kanazawa, Kazutaka Sone, Katsushi Namba, Mikihiko Yamamoto
How Does Defect Removal Activity of Developer Vary with Development Experience?
SEKE, 2015.
@inproceedings{SEKE-2015-AndoSUWFIOHKSNY, author = "Reou Ando and Seiji Sato and Chihiro Uchida and Hironori Washizaki and Yoshiaki Fukazawa and Sakae Inoue and Hiroyuki Ono and Yoshiiku Hanai and Masanobu Kanazawa and Kazutaka Sone and Katsushi Namba and Mikihiko Yamamoto", booktitle = "{Proceedings of the 27th International Conference on Software Engineering and Knowledge Engineering}", doi = "10.18293/SEKE2015-221", isbn = "1-891706-35-7", pages = "540--545", publisher = "{KSI Research Inc. and Knowledge Systems Institute Graduate School}", title = "{How Does Defect Removal Activity of Developer Vary with Development Experience?}", year = 2015, }