Travelled to:
1 × USA
Collaborated with:
R.Ando S.Sato C.Uchida H.Washizaki Y.Fukazawa S.Inoue Y.Hanai M.Kanazawa K.Sone K.Namba M.Yamamoto
Talks about:
develop (2) experi (1) defect (1) remov (1) activ (1) vari (1) doe (1)
Person: Hiroyuki Ono
DBLP: Ono:Hiroyuki
Contributed to:
Wrote 1 papers:
- SEKE-2015-AndoSUWFIOHKSNY #developer #development #experience #fault #how #process #question
- How Does Defect Removal Activity of Developer Vary with Development Experience? (RA, SS, CU, HW, YF, SI, HO, YH, MK, KS, KN, MY), pp. 540–545.