Travelled to:1 × France
Collaborated with:F.J.Kurdahi A.Sasan H.Homayoun A.Khajeh A.Gupta N.Dutt K.S.Khouri M.S.Abadir
Talks about:awar (2) temperatur (1) frequenc (1) reliabl (1) process (1) aggress (1) voltag (1) variat (1) memori (1) design (1)
Person: Ahmed M. Eltawil
DBLP: Eltawil:Ahmed_M=
Contributed to:
2009Wrote 2 papers:
- DATE-2009-KhajehGDKEKA #design #memory management #named #reliability
- TRAM: A tool for Temperature and Reliability Aware Memory Design (AK, AG, ND, FJK, AME, KSK, MSA), pp. 340–345.
- DATE-2009-SasanHEK #process #scalability
- Process Variation Aware SRAM/Cache for aggressive voltage-frequency scaling (AS, HH, AME, FJK), pp. 911–916.