Travelled to:
2 × USA
Collaborated with:
D.Sciuto P.Faverio M.Bombana P.Cavalloro F.Ferrandi G.Zaza
Talks about:
critic (2) implement (1) function (1) testabl (1) success (1) circuit (1) analysi (1) within (1) factor (1) expert (1)
Person: Giacomo Buonanno
DBLP: Buonanno:Giacomo
Contributed to:
Wrote 2 papers:
- ICEIS-v1-2005-FaverioSB #enterprise #implementation #process #using
- Using Critical Success Factors for Assessing Critical Activities in ERP Implementation within SMEs (PF, DS, GB), pp. 285–292.
- SEKE-1993-BombanaBCFSZ #analysis #functional #testing
- An Expert Solution to Functional Testability Analysis of VLSI Circuits (MB, GB, PC, FF, DS, GZ), pp. 263–265.