Travelled to:
1 × Germany
Collaborated with:
T.Inoue
Talks about:
sequenti (1) generat (1) circuit (1) combin (1) stuck (1) singl (1) fault (1) acycl (1) test (1) atpg (1)
Person: Hideyuki Ichihara
DBLP: Ichihara:Hideyuki
Contributed to:
Wrote 1 papers:
- DATE-2003-IchiharaI #fault #generative #testing
- Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG (HI, TI), pp. 11180–11181.