Travelled to:2 × USA
Collaborated with:H.Ou Y.Chang T.Chen T.Kuan
Talks about:analog (3) placement (2) current (2) rout (2) lithographi (1) multilevel (1) constraint (1) simultan (1) consider (1) uniform (1)
Person: Hsing-Chih Chang Chien
DBLP: Chien:Hsing=Chih_Chang
Contributed to:
20132012Wrote 3 papers:
- DAC-2013-ChienOCKC
- Double patterning lithography-aware analog placement (HCCC, HCO, TCC, TYK, YWC), p. 6.
- DAC-2013-OuCC
- Simultaneous analog placement and routing with current flow and current density considerations (HCO, HCCC, YWC), p. 6.
- DAC-2012-OuCC #constraints #multi
- Non-uniform multilevel analog routing with matching constraints (HCO, HCCC, YWC), pp. 549–554.