Travelled to:3 × USA
Collaborated with:J.Rajski D.Goswami M.Kassab S.Hellebrand M.Marek-Sadowska S.Huang Y.Lin W.Cheng S.K.Sunter Y.Chou D.Kwai
Talks about:generat (2) test (2) constraint (1) autocorrel (1) starbist (1) presenc (1) pattern (1) random (1) except (1) small (1)
Person: Kun-Han Tsai
DBLP: Tsai:Kun=Han
Contributed to:
201220071997Wrote 3 papers:
- DAC-2012-HuangLTCSCK #3d #testing
- Small delay testing for TSVs in 3-D ICs (SYH, YHL, KHT, WTC, SKS, YFC, DMK), pp. 1031–1036.
- DAC-2007-GoswamiTKR #constraints #exception #generative #testing
- Test Generation in the Presence of Timing Exceptions and Constraints (DG, KHT, MK, JR), pp. 688–693.
- DAC-1997-TsaiHRM #generative #named #random
- STARBIST: Scan Autocorrelated Random Pattern Generation (KHT, SH, JR, MMS), pp. 472–477.