Travelled to:2 × France
Collaborated with:H.Ymeri B.Nauwelaers K.Maex D.D.Roest S.Vandenberghe I.Karageorgos P.Raghavan J.Ryckaert Z.Tokei D.Verkest R.Baert S.Sakhare W.Dehaene
Talks about:interconnect (2) semiconduct (1) substrat (1) approach (1) variabl (1) pattern (1) paramet (1) multipl (1) impact (1) effici (1)
Person: Michele Stucchi
DBLP: Stucchi:Michele
Contributed to:
20152002Wrote 2 papers:
- DATE-2015-KarageorgosSRRT #multi #variability
- Impact of interconnect multiple-patterning variability on SRAMs (IK, MS, PR, JR, ZT, DV, RB, SS, WD), pp. 609–612.
- DATE-2002-YmeriNMRSV #approach #parametricity #performance
- Simple and Efficient Approach for Shunt Admittance Parameters Calculations of VLSI On-Chip Interconnects on Semiconducting Substrate (HY, BN, KM, DDR, MS, SV), p. 1113.