Travelled to:1 × Austria
1 × Canada
1 × China
1 × Italy
1 × Japan
1 × Portugal
1 × South Korea
1 × The Netherlands
2 × USA
Collaborated with:Y.L.Traon C.Henard M.Harman G.Perrouin J.Klein M.E.Delamaro M.Kintis N.Malevris T.T.Chekam Y.Jia T.Ziadi M.Ziane X.Devroey M.Cordy A.Legay P.Schobbens M.Jimenez R.Rwemalika F.Sarro S.Bardin M.Delahaye R.David N.Kosmatov J.Marion
Talks about:mutat (7) mutant (5) test (5) softwar (4) analysi (4) product (3) equival (3) fault (3) line (3) use (3)
Person: Mike Papadakis
DBLP: Papadakis:Mike
Facilitated 1 volumes:
PrCoContributed to:
2015
2015
20142014
201420132013
2013
20132012
2019Wrote 15 papers:
- ICSE-v1-2015-HenardPHT #configuration management #constraints #multi #product line #scalability #theorem proving
- Combining Multi-Objective Search and Constraint Solving for Configuring Large Software Product Lines (CH, MP, MH, YLT), pp. 517–528.
- ICSE-v1-2015-PapadakisJHT #compilation #detection #effectiveness #empirical #equivalence #performance #scalability
- Trivial Compiler Equivalence: A Large Scale Empirical Study of a Simple, Fast and Effective Equivalent Mutant Detection Technique (MP, YJ, MH, YLT), pp. 936–946.
- ICST-2015-BardinDDKPTM #detection #requirements
- Sound and Quasi-Complete Detection of Infeasible Test Requirements (SB, MD, RD, NK, MP, YLT, JYM), pp. 1–10.
- FSE-2014-DevroeyPCPLS #analysis #mutation testing #variability
- A variability perspective of mutation analysis (XD, GP, MC, MP, AL, PYS), pp. 841–844.
- ICST-2014-PapadakisHT #analysis #combinator #interactive #mutation testing #testing
- Sampling Program Inputs with Mutation Analysis: Going Beyond Combinatorial Interaction Testing (MP, CH, YLT), pp. 1–10.
- SAC-2014-PapadakisT #analysis #approach #effectiveness #fault #locality #mutation testing
- Effective fault localization via mutation analysis: a selective mutation approach (MP, YLT), pp. 1293–1300.
- SAC-2014-ZiadiHPZT #approach #independence #product line #towards
- Towards a language-independent approach for reverse-engineering of software product lines (TZ, CH, MP, MZ, YLT), pp. 1064–1071.
- ICSE-2013-HenardPPKT #automation #feature model #modelling #testing #towards
- Towards automated testing and fixing of re-engineered feature models (CH, MP, GP, JK, YLT), pp. 1245–1248.
- SAC-2013-PapadakisT #classification #mutation testing #testing #using
- Mutation testing strategies using mutant classification (MP, YLT), pp. 1223–1229.
- SCAM-2013-PapadakisDT #analysis #fault #mutation testing #named #using
- Proteum/FL: A tool for localizing faults using mutation analysis (MP, MED, YLT), pp. 94–99.
- SPLC-2013-HenardPPKT #generative #multi #product line #testing
- Multi-objective test generation for software product lines (CH, MP, GP, JK, YLT), pp. 62–71.
- ICST-2012-KintisPM #first-order #higher-order
- Isolating First Order Equivalent Mutants via Second Order Mutation (MK, MP, NM), pp. 701–710.
- ICST-2012-PapadakisT #fault #using
- Using Mutants to Locate “Unknown” Faults (MP, YLT), pp. 691–700.
- ESEC-FSE-2019-ChekamPT #generative #named
- Mart: a mutant generation tool for LLVM (TTC, MP, YLT), pp. 1080–1084.
- ESEC-FSE-2019-JimenezRPSTH #predict
- The importance of accounting for real-world labelling when predicting software vulnerabilities (MJ, RR, MP, FS, YLT, MH), pp. 695–705.