Travelled to:1 × Germany
Collaborated with:M.Beck O.Barondeau M.Kaibel F.Poehl X.Lin
Talks about:test (2) implement (1) qualiti (1) generat (1) impact (1) detail (1) design (1) logic (1) delay (1) clock (1)
Person: Ron Press
DBLP: Press:Ron
Contributed to:
2005Wrote 1 papers:
- DATE-2005-BeckBKPLP #design #generative #implementation #logic #quality
- Logic Design for On-Chip Test Clock Generation — Implementation Details and Impact on Delay Test Quality (MB, OB, MK, FP, XL, RP), pp. 56–61.