Travelled to:1 × Italy
2 × USA
Collaborated with:M.Fujita H.Yoshida K.De S.P.Rajan K.Takayama R.Mukherjee J.Jain P.Bollineni
Talks about:base (2) characterist (1) standard (1) sequenti (1) diagnosi (1) multipl (1) layout (1) xlist (1) model (1) estim (1)
Person: Vamsi Boppana
DBLP: Boppana:Vamsi
Contributed to:
2004
19991999Wrote 3 papers:
- DAC-2004-YoshidaDB #estimation #standard
- Accurate pre-layout estimation of standard cell characteristics (HY, KD, VB), pp. 208–211.
- CAV-1999-BoppanaRTF #model checking
- Model Checking Based on Sequential ATPG (VB, SPR, KT, MF), pp. 418–430.
- DAC-1999-BoppanaMJFB #fault #multi
- Multiple Error Diagnosis Based on Xlists (VB, RM, JJ, MF, PB), pp. 660–665.