Collaborated with:
Y.Zhou B.Xu H.Lu M.Harman J.Krinke S.S.Islam D.Binkley J.Liu Y.Zhao L.X.0003 H.Leung Y.J.0001 Z.Z.0002 Y.Wang H.Sun
Talks about:
predict (2) effort (2) model (2) awar (2) unsupervis (1) supervis (1) coverag (1) cluster (1) automat (1) profil (1)
Person: Yibiao Yang
DBLP: Yang:Yibiao
Contributed to:
Wrote 3 papers:
- ASE-2016-YangHKIBZX #clustering #dependence #empirical #predict
- An empirical study on dependence clusters for effort-aware fault-proneness prediction (YY, MH, JK, SSI, DB, YZ, BX), pp. 296–307.
- FSE-2016-YangZLZL0XL #fault #modelling #predict
- Effort-aware just-in-time defect prediction: simple unsupervised models could be better than supervised models (YY, YZ, JL, YZ, HL, LX0, BX, HL), pp. 157–168.
- ASE-2019-YangJ0WSLZX #automation #self #test coverage
- Automatic Self-Validation for Code Coverage Profilers (YY, YJ0, ZZ0, YW, HS, HL, YZ, BX), pp. 79–90.