Travelled to:
1 × France
1 × USA
Collaborated with:
R.Takahashi Z.E.Rákossy M.Hiromoto H.Tsutsui T.Sato H.Ochi
Talks about:
architectur (1) interfac (1) function (1) program (1) densiti (1) complex (1) perman (1) effect (1) mitig (1) fault (1)
Person: Yukihiro Nakamura
DBLP: Nakamura:Yukihiro
Contributed to:
Wrote 2 papers:
- DATE-2013-RakossyHTSNO #architecture #array #fault #functional #testing
- Hot-swapping architecture with back-biased testing for mitigation of permanent faults in functional unit array (ZER, MH, HT, TS, YN, HO), pp. 535–540.
- ICSM-1996-TakahashiN #complexity #fault #interface
- The effect of interface complexity on program error density (RT, YN), pp. 77–86.