Yaw-Jen Chang
Fault detection for plasma-enhanced chemical vapor deposition process using feature extraction
CASE, 2012.
@inproceedings{CASE-2012-Chang, author = "Yaw-Jen Chang", booktitle = "{Proceedings of the Eighth International Conference on Automation Science and Engineering}", doi = "10.1109/CoASE.2012.6386497", isbn = "978-1-4673-0429-0", pages = "491--496", publisher = "{IEEE}", title = "{Fault detection for plasma-enhanced chemical vapor deposition process using feature extraction}", year = 2012, }