Travelled to:
1 × Korea
Collaborated with:
∅
Talks about:
process (1) extract (1) deposit (1) plasma (1) featur (1) enhanc (1) detect (1) chemic (1) vapor (1) fault (1)
Person: Yaw-Jen Chang
DBLP: Chang:Yaw=Jen
Contributed to:
Wrote 1 papers:
- CASE-2012-Chang #detection #fault #feature model #process #using
- Fault detection for plasma-enhanced chemical vapor deposition process using feature extraction (YJC), pp. 491–496.