Ying-Jen Chen, Bo-Cheng Wang, Jei-Zheng Wu, Yi-Chia Wu, Chen-Fu Chien
Big data analytic for multivariate fault detection and classification in semiconductor manufacturing
CASE, 2017.
@inproceedings{CASE-2017-ChenWWWC, author = "Ying-Jen Chen and Bo-Cheng Wang and Jei-Zheng Wu and Yi-Chia Wu and Chen-Fu Chien", booktitle = "{Proceedings of the 13th International Conference on Automation Science and Engineering}", doi = "10.1109/COASE.2017.8256190", isbn = "978-1-5090-6781-7", pages = "731--736", publisher = "{IEEE}", title = "{Big data analytic for multivariate fault detection and classification in semiconductor manufacturing}", year = 2017, }