Transistor level test generation for MOS circuits
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Madhukar K. Reddy, Sudhakar M. Reddy, Prathima Agrawal
Transistor level test generation for MOS circuits
DAC, 1985.

DAC 1985
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@inproceedings{DAC-1985-ReddyRA,
	author        = "Madhukar K. Reddy and Sudhakar M. Reddy and Prathima Agrawal",
	booktitle     = "{Proceedings of the 22nd Design Automation Conference}",
	doi           = "10.1145/317825.318007",
	isbn          = "0-8186-0635-5",
	pages         = "825--828",
	publisher     = "{ACM}",
	title         = "{Transistor level test generation for MOS circuits}",
	year          = 1985,
}

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