Kuniaki Kishida, F. Shirotori, Y. Ikemoto, Shun Ishiyama, Terumine Hayashi
A delay test system for high speed logic LSI’s
DAC, 1986.
@inproceedings{DAC-1986-KishidaSIIH,
author = "Kuniaki Kishida and F. Shirotori and Y. Ikemoto and Shun Ishiyama and Terumine Hayashi",
booktitle = "{Proceedings of the 23rd Design Automation Conference}",
doi = "10.1145/318013.318161",
pages = "786--790",
publisher = "{IEEE Computer Society Press}",
title = "{A delay test system for high speed logic LSI’s}",
year = 1986,
}