Hyung Ki Lee, Dong Sam Ha, K. Kim
Test Generation of Stuck-open Faults Using Stuck-at Test Sets in CMOS Combinational Circuits
DAC, 1989.
@inproceedings{DAC-1989-LeeHK,
author = "Hyung Ki Lee and Dong Sam Ha and K. Kim",
booktitle = "{Proceedings of the 26th Design Automation Conference}",
doi = "10.1145/74382.74440",
pages = "345--350",
publisher = "{ACM Press}",
title = "{Test Generation of Stuck-open Faults Using Stuck-at Test Sets in CMOS Combinational Circuits}",
year = 1989,
}