Travelled to:1 × USA
2 × Italy
Collaborated with:S.Hong L.J.Henschen H.K.Lee D.S.Ha
Talks about:stuck (2) fault (2) test (2) telecommun (1) parallel (1) identifi (1) network (1) generat (1) environ (1) databas (1)
Person: K. Kim
DBLP: Kim:K=
Contributed to:
1998
1992
1989Wrote 3 papers:
- CSMR-1998-HongK #empirical #fault #identification
- Identifying Fault Prone Modules: An Empirical Study in Telecommunication System (SH, KK), pp. 179–184.
- SEKE-1992-KimH #database #deduction #evaluation #parallel #recursion
- Network-Based Simple Recursive Answer Evaluation for Deductive Databases in Parallel Environment (KK, LJH), pp. 63–70.
- DAC-1989-LeeHK #fault #generative #testing #using
- Test Generation of Stuck-open Faults Using Stuck-at Test Sets in CMOS Combinational Circuits (HKL, DSH, KK), pp. 345–350.