SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits
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Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer
SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits
DAC, 1992.

DAC 1992
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@inproceedings{DAC-1992-LeeNB,
	acmid         = "113938.113931",
	author        = "Kuen-Jong Lee and Charles Njinda and Melvin A. Breuer",
	booktitle     = "{Proceedings of the 29th Design Automation Conference}",
	isbn          = "0-8186-2822-7",
	pages         = "26--29",
	publisher     = "{IEEE Computer Society Press}",
	title         = "{SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits}",
	year          = 1992,
}

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