Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz
Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction
DAC, 1999.
@inproceedings{DAC-1999-GuoRP,
author = "Ruifeng Guo and Sudhakar M. Reddy and Irith Pomeranz",
booktitle = "{Proceedings of the 36th Design Automation Conference}",
doi = "10.1145/309847.310019",
pages = "653--659",
publisher = "{ACM Press}",
title = "{Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction}",
year = 1999,
}











