Travelled to:1 × USA
2 × France
Collaborated with:S.M.Reddy I.Pomeranz X.Tang W.Cheng
Talks about:test (4) sequenti (2) pattern (2) generat (2) compact (2) circuit (2) base (2) synchron (1) proptest (1) properti (1)
Person: Ruifeng Guo
DBLP: Guo:Ruifeng
Contributed to:
2009
19991998Wrote 3 papers:
- DATE-2009-TangGCR #generative #multi
- Improving compressed test pattern generation for multiple scan chain failure diagnosis (XT, RG, WTC, SMR), pp. 1000–1005.
- DAC-1999-GuoRP #generative #named #using
- Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction (RG, SMR, IP), pp. 653–659.
- DATE-1998-GuoPR #sequence #testing
- Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector Restoration (RG, IP, SMR), pp. 583–587.