Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices
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Yi-Min Jiang, Kwang-Ting Cheng
Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices
DAC, 1999.

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@inproceedings{DAC-1999-JiangC,
	author        = "Yi-Min Jiang and Kwang-Ting Cheng",
	booktitle     = "{Proceedings of the 36th Design Automation Conference}",
	doi           = "10.1145/309847.310053",
	pages         = "760--765",
	publisher     = "{ACM Press}",
	title         = "{Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices}",
	year          = 1999,
}

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