Amit Agarwal, Chris H. Kim, Saibal Mukhopadhyay, Kaushik Roy
Leakage in nano-scale technologies: mechanisms, impact and design considerations
DAC, 2004.
@inproceedings{DAC-2004-AgarwalKMR, author = "Amit Agarwal and Chris H. Kim and Saibal Mukhopadhyay and Kaushik Roy", booktitle = "{Proceedings of the 41st Design Automation Conference}", doi = "10.1145/996566.996571", isbn = "1-58113-828-8", pages = "6--11", publisher = "{ACM}", title = "{Leakage in nano-scale technologies: mechanisms, impact and design considerations}", year = 2004, }