Leakage in nano-scale technologies: mechanisms, impact and design considerations
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Amit Agarwal, Chris H. Kim, Saibal Mukhopadhyay, Kaushik Roy
Leakage in nano-scale technologies: mechanisms, impact and design considerations
DAC, 2004.

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@inproceedings{DAC-2004-AgarwalKMR,
	author        = "Amit Agarwal and Chris H. Kim and Saibal Mukhopadhyay and Kaushik Roy",
	booktitle     = "{Proceedings of the 41st Design Automation Conference}",
	doi           = "10.1145/996566.996571",
	isbn          = "1-58113-828-8",
	pages         = "6--11",
	publisher     = "{ACM}",
	title         = "{Leakage in nano-scale technologies: mechanisms, impact and design considerations}",
	year          = 2004,
}

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