@inproceedings{DAC-2004-RaoDBS,
	author        = "Rajeev R. Rao and Anirudh Devgan and David Blaauw and Dennis Sylvester",
	booktitle     = "{Proceedings of the 41st Design Automation Conference}",
	doi           = "10.1145/996566.996693",
	isbn          = "1-58113-828-8",
	pages         = "442--447",
	publisher     = "{ACM}",
	title         = "{Parametric yield estimation considering leakage variability}",
	year          = 2004,
}