Timing-based delay test for screening small delay defects
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Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
Timing-based delay test for screening small delay defects
DAC, 2006.

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@inproceedings{DAC-2006-AhmedTJ,
	author        = "Nisar Ahmed and Mohammad Tehranipoor and Vinay Jayaram",
	booktitle     = "{Proceedings of the 43rd Design Automation Conference}",
	doi           = "10.1145/1146909.1146993",
	isbn          = "1-59593-381-6",
	pages         = "320--325",
	publisher     = "{ACM}",
	title         = "{Timing-based delay test for screening small delay defects}",
	year          = 2006,
}

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