Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski
A test pattern ordering algorithm for diagnosis with truncated fail data
DAC, 2006.
@inproceedings{DAC-2006-ChenRPR,
author = "Gang Chen and Sudhakar M. Reddy and Irith Pomeranz and Janusz Rajski",
booktitle = "{Proceedings of the 43rd Design Automation Conference}",
doi = "10.1145/1146909.1147015",
isbn = "1-59593-381-6",
pages = "399--404",
publisher = "{ACM}",
title = "{A test pattern ordering algorithm for diagnosis with truncated fail data}",
year = 2006,
}