Xin Li, Lawrence T. Pileggi
Efficient Parametric Yield Extraction for Multiple Correlated Non-Normal Performance Distributions of Analog/RF Circuits
DAC, 2007.
@inproceedings{DAC-2007-LiP,
author = "Xin Li and Lawrence T. Pileggi",
booktitle = "{Proceedings of the 44th Design Automation Conference}",
doi = "10.1145/1278480.1278709",
pages = "928--933",
publisher = "{IEEE}",
title = "{Efficient Parametric Yield Extraction for Multiple Correlated Non-Normal Performance Distributions of Analog/RF Circuits}",
year = 2007,
}











