Sudhakar M. Reddy, Irith Pomeranz, Chen Liu
On tests to detect via opens in digital CMOS circuits
DAC, 2008.
@inproceedings{DAC-2008-ReddyPL,
author = "Sudhakar M. Reddy and Irith Pomeranz and Chen Liu",
booktitle = "{Proceedings of the 45th Design Automation Conference}",
doi = "10.1145/1391469.1391682",
isbn = "978-1-60558-115-6",
pages = "840--845",
publisher = "{ACM}",
title = "{On tests to detect via opens in digital CMOS circuits}",
year = 2008,
}