Wei Xu, Yiran Chen, Xiaobin Wang, Tong Zhang
Improving STT MRAM storage density through smaller-than-worst-case transistor sizing
DAC, 2009.
@inproceedings{DAC-2009-XuCWZ,
author = "Wei Xu and Yiran Chen and Xiaobin Wang and Tong Zhang",
booktitle = "{Proceedings of the 46th Design Automation Conference}",
doi = "10.1145/1629911.1629936",
isbn = "978-1-60558-497-3",
pages = "87--90",
publisher = "{ACM}",
title = "{Improving STT MRAM storage density through smaller-than-worst-case transistor sizing}",
year = 2009,
}