Peter Wohl, John A. Waicukauski, Frederic Neuveux, Emil Gizdarski
Fully X-tolerant, very high scan compression
DAC, 2010.
@inproceedings{DAC-2010-WohlWNG, author = "Peter Wohl and John A. Waicukauski and Frederic Neuveux and Emil Gizdarski", booktitle = "{Proceedings of the 47th Design Automation Conference}", doi = "10.1145/1837274.1837366", isbn = "978-1-4503-0002-5", pages = "362--367", publisher = "{ACM}", title = "{Fully X-tolerant, very high scan compression}", year = 2010, }