Jim Aarestad, Charles Lamech, Jim Plusquellic, Dhruva Acharyya, Kanak Agarwal
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect
DAC, 2011.
@inproceedings{DAC-2011-AarestadLPAA,
author = "Jim Aarestad and Charles Lamech and Jim Plusquellic and Dhruva Acharyya and Kanak Agarwal",
booktitle = "{Proceedings of the 48th Design Automation Conference}",
doi = "10.1145/2024724.2024848",
isbn = "978-1-4503-0636-2",
pages = "534--539",
publisher = "{ACM}",
title = "{Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect}",
year = 2011,
}