Yongchan Ban, Jae-Seok Yang
Layout aware line-edge roughness modeling and poly optimization for leakage minimization
DAC, 2011.
@inproceedings{DAC-2011-BanY,
author = "Yongchan Ban and Jae-Seok Yang",
booktitle = "{Proceedings of the 48th Design Automation Conference}",
doi = "10.1145/2024724.2024828",
isbn = "978-1-4503-0636-2",
pages = "447--452",
publisher = "{ACM}",
title = "{Layout aware line-edge roughness modeling and poly optimization for leakage minimization}",
year = 2011,
}











