Yongchan Ban, Jae-Seok Yang
Layout aware line-edge roughness modeling and poly optimization for leakage minimization
DAC, 2011.
@inproceedings{DAC-2011-BanY, author = "Yongchan Ban and Jae-Seok Yang", booktitle = "{Proceedings of the 48th Design Automation Conference}", doi = "10.1145/2024724.2024828", isbn = "978-1-4503-0636-2", pages = "447--452", publisher = "{ACM}", title = "{Layout aware line-edge roughness modeling and poly optimization for leakage minimization}", year = 2011, }