Travelled to:
2 × USA
Collaborated with:
Y.Ban K.Athikulwongse Y.Lee S.K.Lim D.Z.Pan
Talks about:
layout (2) optim (2) awar (2) analysi (1) stress (1) leakag (1) applic (1) rough (1) model (1) minim (1)
Person: Jae-Seok Yang
DBLP: Yang:Jae=Seok
Contributed to:
Wrote 2 papers:
- DAC-2011-BanY #layout #modelling #optimisation
- Layout aware line-edge roughness modeling and poly optimization for leakage minimization (YB, JSY), pp. 447–452.
- DAC-2010-YangALLP #3d #analysis #layout #optimisation
- TSV stress aware timing analysis with applications to 3D-IC layout optimization (JSY, KA, YJL, SKL, DZP), pp. 803–806.