Lionel Vincent, Philippe Maurine, Suzanne Lesecq, Edith Beigné
Embedding statistical tests for on-chip dynamic voltage and temperature monitoring
DAC, 2012.
@inproceedings{DAC-2012-LionelPSE,
author = "Lionel Vincent and Philippe Maurine and Suzanne Lesecq and Edith Beigné",
booktitle = "{Proceedings of the 49th Annual Design Automation Conference}",
doi = "10.1145/2228360.2228539",
isbn = "978-1-4503-1199-1",
pages = "994--999",
publisher = "{ACM}",
title = "{Embedding statistical tests for on-chip dynamic voltage and temperature monitoring}",
year = 2012,
}