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Travelled to:
1 × USA
Collaborated with:
P.Maurine S.Lesecq E.Beigné
Talks about:
temperatur (1) statist (1) monitor (1) voltag (1) embed (1) dynam (1) test (1) chip (1)

Person: Lionel Vincent

DBLP DBLP: Vincent:Lionel

Contributed to:

DAC 20122012

Wrote 1 papers:

DAC-2012-LionelPSE #monitoring #statistics #testing
Embedding statistical tests for on-chip dynamic voltage and temperature monitoring (LV, PM, SL, EB), pp. 994–999.
Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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