Yang Li, David Z. Pan
An accurate semi-analytical framework for full-chip TSV-induced stress modeling
DAC, 2013.
@inproceedings{DAC-2013-LiP,
author = "Yang Li and David Z. Pan",
booktitle = "{Proceedings of the 50th Annual Design Automation Conference}",
doi = "10.1145/2463209.2488957",
isbn = "978-1-4503-2071-9",
pages = "8",
publisher = "{ACM}",
title = "{An accurate semi-analytical framework for full-chip TSV-induced stress modeling}",
year = 2013,
}