Bei Yu, Kun Yuan, Jhih-Rong Gao, David Z. Pan
E-BLOW: e-beam lithography overlapping aware stencil planning for MCC system
DAC, 2013.
@inproceedings{DAC-2013-YuYGP, author = "Bei Yu and Kun Yuan and Jhih-Rong Gao and David Z. Pan", booktitle = "{Proceedings of the 50th Annual Design Automation Conference}", doi = "10.1145/2463209.2488819", isbn = "978-1-4503-2071-9", pages = "7", publisher = "{ACM}", title = "{E-BLOW: e-beam lithography overlapping aware stencil planning for MCC system}", year = 2013, }